Decades of leadership in the DoD and commercial sectors
Microelectronics SME
Total Dose Testing of 10-bit Low Voltage Differential Signal (LVDS) Serializer and Deserializer
B. Hamilton and T. Turflinger, IEEE Nuclear and Space Radiation Effects Conference (NSREC).
1 of 12 Patents
Dual magnification apparatus and system for examining a single objective in a scanning optical microscope using two wavelengths of light - Patent # 10,139,609
Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.
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